Tuesday, July 14, 2015

First 7nm node test chips developed

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A new manufacturing technique has the potential to see a whopping 20 billion transistors packed into a chip the size of a fingernail

IBM Research has successfully created the first 7nm node test chip with functioning transistors, a development that could lead to processors that boast four times the capacity of those on the market today.

.. Continue Reading First 7nm node test chips developed

Section: Electronics

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via http://www.gizmag.com/

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